Stage micrometers calibration zviyero magridi

Tsanangudzo Pfupi

Substrate:B270
Dimensional Tolerance:-0.1mm
Makobvu Tolerance:± 0.05mm
Surface Flatness:3(1)@632.8nm
Surface Quality:40/20
Line Width:0.1mm uye 0.05mm
Edges:Pasi, 0.3mm max. Yakazara yakafara bevel
Clear Aperture:90%
Parallelism:<5”
Coating:High optical density opaque chrome,Tabs <0.01%@Visible Wavelength
Transparent Area, AR: R<0.35%@Visible Wavelength


Product Detail

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Product Description

Stage micrometers, calibration vatongi, uye grids anowanzo shandiswa mumicroscope uye mamwe ekufungidzira maapplication kuti ape akajairwa referensi zviyero zvekuyera uye calibration. Midziyo iyi inowanzoiswa yakananga pa microscope nhanho uye inoshandiswa kuratidza magnification uye optical zvimiro zvehurongwa.

A stage micrometer igirazi diki siraidhi ine gidhi yemitsara yakanyatso nyorwa pane inozivikanwa nzvimbo. MaGridhi anowanzo shandiswa kuyera kukwidziridzwa kwemamicroscopes kuti abvumire saizi chaiyo uye kuyerwa kwenhambwe yemasampuli.

Calibration vatongi uye magridi akafanana nestage micrometers mukuti ane gidhi kana imwe patani yemitsara yakanyatsotsanangurwa. Zvisinei, zvinogona kugadzirwa nezvimwe zvinhu, zvakadai sesimbi kana plastiki, uye zvakasiyana mukukura uye chimiro.

Aya maturusi ekuenzanisa akakosha pakuyera nemasamples pasi pemaikorosikopu. Nekushandisa inozivikanwa referensi chiyero, vaongorori vanogona kuona kuti zviyero zvavo ndezvechokwadi uye zvakavimbika. Iwo anowanzo shandiswa muminda senge biology, zvinhu sainzi uye zvemagetsi kuyera saizi, chimiro uye zvimwe zvimiro zvemuenzaniso.

Kuunza Stage Micrometer Calibration Scale Grids - mhinduro ine hunyanzvi uye yakavimbika yekuona zviyero zvakaringana mumaindasitiri akasiyana siyana. Iine huwandu hwemashandisirwo akasiyana, ichi chigadzirwa chakasiyana-siyana chinopa kurongeka kusingaenzaniswi uye nyore, zvichiita kuti ive chishandiso chakakosha kune nyanzvi muminda yakadai semicroscope, imaging uye biology.

Pamwoyo wesisitimu pane nhanho micrometer, iyo inopa vakapedza kudzidza mareferensi maturusi ekuyera maturusi ekuyera senge microscopes nemakamera. Aya ma micrometer akasimba, emhando yepamusoro anouya muhukuru hwakasiyana-siyana uye maitiro kuti asangane nezvinodiwa zvemaindasitiri akasiyana, kubva kune akareruka mutsara-mutsetse zviyero kusvika kune yakaoma grid ane michinjikwa yakawanda uye madenderedzwa. Ese mamicrometer akatemerwa laser kurongeka uye anoratidza yakakwira-kusiyanisa dhizaini kuitira nyore kushandisa.

Chimwe chinhu chakakosha cheiyo system ndeye calibration scale. Zvikero zvakanyatsogadzirwa izvi zvinopa chitarisiko chezviyero uye chishandiso chakakosha chekuenzanisa michina yekuyeresa sematanho emaikorosikopu nematanho eshanduro eXY. Zviyero zvinogadzirwa zvemhando yepamusoro kuti ive nechokwadi chekugara uye hupenyu hurefu, uye anowanikwa muhukuru hwakasiyana kuti asangane nezvinodiwa zvekushandisa kwakasiyana.

Chekupedzisira, GRIDS inopa yakakosha nzvimbo yereferensi yezviyero chaizvo. Aya magridi anouya mumhando dzakasiyana-siyana, kubva kune magridi akareruka kusvika kune yakaoma michinjikwa uye madenderedzwa, achipa ratidziro yekuona yezviyero chaizvo. Giridhi yega yega yakagadzirirwa kusimba neyakasiyana-siyana, laser-etched pateni yekurongeka kwepamusoro.

Imwe yemabhenefiti makuru eiyo STAGE MICROMETERS CALIBRATION SCALES GRIDS sisitimu ndiko kureruka kwayo uye kuita zvakasiyana. Iine huwandu hweakasiyana mamicrometer, zvikero uye magiradhi ekusarudza kubva, vashandisi vanogona kusarudza musanganiswa wakakwana wekushandisa kwavo chaiko. Ingave murabhoritari, munda kana fekitori, sisitimu inopa chokwadi uye kuvimbika zvinodiwa nenyanzvi.

Saka kana iwe uchitsvaga yakavimbika, yemhando yepamusoro mhinduro kune yako kuyerwa zvaunoda, usatarise kupfuura Stage Micrometer Calibration Ruler Grids. Nekurongeka kwayo kwakasarudzika, kusimba uye nyore, iyi sisitimu ine chokwadi chekuva chishandiso chakakosha mune yako nyanzvi arsenal.

nhanho micrometers calibration zviyero magridi (1)
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Zvinotsanangurwa

Substrate

B270

Dimensional Tolerance

-0.1mm

Makobvu Tolerance

± 0.05mm

Surface Flatness

3(1)@632.8nm

Surface Quality

40/20

Line Width

0.1mm uye 0.05mm

Edges

Pasi, 0.3mm max. Yakazara yakafara bevel

Clear Aperture

90%

Parallelism

<45”

Coating

         

High optical density opaque chrome,Tabs <0.01%@Visible Wavelength

Transparent Area, AR R<0.35%@Visible Wavelength


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